Title :
Evaluation of MOSFET Reliability in Analog Applications
Author :
R. Thewes;R. Brederlow;C. Schlunder;P. Wieczorek;B. Ankele;A. Hesener;J. Holz;S. Kessel;W. Weber
Author_Institution :
Infineon Technologies AG, Munich, Germany
fDate :
6/23/1905 12:00:00 AM
Keywords :
MOSFET circuits
Conference_Titel :
Solid-State Device Research Conference, 2001. Proceeding of the 31st European
Print_ISBN :
2-914601-01-8
DOI :
10.1109/ESSDERC.2001.195207
