DocumentCode :
3620613
Title :
Noise and reliability containment approaches
Author :
G. Roberts;R. Aitken
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
20
Lastpage :
21
Keywords :
"Noise robustness","Circuit noise","Microelectronics","Availability","Design methodology","Fault tolerant systems","System testing","Process design","Manufacturing processes","Test data compression"
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
Print_ISBN :
0-7803-9023-7
Type :
conf
DOI :
10.1109/CICC.2005.1568598
Filename :
1568598
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3620613
