• DocumentCode
    3620613
  • Title

    Noise and reliability containment approaches

  • Author

    G. Roberts;R. Aitken

  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    20
  • Lastpage
    21
  • Keywords
    "Noise robustness","Circuit noise","Microelectronics","Availability","Design methodology","Fault tolerant systems","System testing","Process design","Manufacturing processes","Test data compression"
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2005. Proceedings of the IEEE 2005
  • Print_ISBN
    0-7803-9023-7
  • Type

    conf

  • DOI
    10.1109/CICC.2005.1568598
  • Filename
    1568598
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3620613