3621167

An automated instrument for the measurement of mechanical properties of thin materials

T. Jackson; Xinya Zhang;E. Lafond

2

2005

6/27/1905 12:00:00 AM

999

1002

"Instruments","Mechanical variables measurement","Mechanical factors","Laser modes","Ultrasonic variables measurement","Frequency","Dispersion","Optical materials","Optical interferometry","Transistors"

ieee

Ultrasonics Symposium, 2005 IEEE

1051-0117

0-7803-9382-1

conf

10.1109/ULTSYM.2005.1603019

1603019