• DocumentCode
    3621496
  • Title

    Further Generalization of the Low-Frequency True-RMS instrument

  • Author

    V. Pjevalica;V. Vujicic

  • Author_Institution
    NIS-GAS, Maintenance Service, Technical Provision Section, Narodnog fronta 12, 21000 Novi Sad, Serbia and Montenegro. E-mail: veljus@nis-gas.com
  • Volume
    2
  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    1008
  • Lastpage
    1011
  • Abstract
    In this paper, it is shown that the use of random uniform dither in harmonics measurement can significantly shorten the word of applied A/D converter and shorten the word of applied base function (sine and/or cosine), stored in memory, without accuracy loosing. This fact enables design of simple instrument for harmonics measurement. It is proven theoretically, by simulation and by experiment that 6-bit dithered A/D converter word, 8-bit dithered base function word, and 6times8 (14-bits) multiplier word assure measurement of 16 harmonics (16 sine and 16 cosine components) with 13-bit accuracy. Putting n such simple devices in parallel it is possible to measure n times 16 harmonics simultaneously. The measurement of 1 times 16 harmonics is realized in the small PLD chip
  • Keywords
    "Instruments","Semiconductor device measurement","Stochastic processes","Power measurement","Measurement uncertainty","Time measurement","Frequency measurement","Polynomials","Measurement errors","Artificial neural networks"
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-8879-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2005.1604291
  • Filename
    1604291