3621536

Modeling and simulation compact models

K. Joardar; Jeong-Taek Kong

2005

6/27/1905 12:00:00 AM

199

199

"Semiconductor device modeling","Circuit simulation","Frequency","Low-frequency noise","Joining processes","Circuit optimization","Nanoscale devices","Leakage current","Circuit noise","Temperature"

ieee

Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International

0-7803-9268-X

conf

10.1109/IEDM.2005.1609305

1609305