• DocumentCode
    3621801
  • Title

    ATPG implemented as an educational tool

  • Author

    A. Zemva;M. Leban;B. Zajc

  • Author_Institution
    Fakulteta za Elektrotehniko in Racunalnistvo, Ljubljana Univ., Yugoslavia
  • fYear
    1991
  • fDate
    6/13/1905 12:00:00 AM
  • Firstpage
    1540
  • Abstract
    The authors present an automatic test pattern generation system, called TEST, developed to upgrade software tools in the field of computer-aided design of digital integrated circuits. The TEST system consists of two modes for test generation. TEST-1 tries to generate a minimal test set for the complete single stuck-at-faults in the circuit, while TEST-2 generates a test for selected single stuck-at faults. Experimental results show that the test sets obtained by TEST-1 are nearly optimal.
  • Keywords
    "Automatic test pattern generation","Circuit testing","System testing","Automatic testing","Integrated circuit testing","Software testing","Software tools","Design automation","Digital integrated circuits","Circuit faults"
  • Publisher
    ieee
  • Conference_Titel
    Electrotechnical Conference, 1991. Proceedings., 6th Mediterranean
  • Print_ISBN
    0-87942-655-1
  • Type

    conf

  • DOI
    10.1109/MELCON.1991.162134
  • Filename
    162134
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3621801