Title :
Noise as a Diagnostic Tool for Quality of GaSb Laser Diodes
Author :
Z. Chobola;J. Vanek;E. Hulicius;T. Simecek
Author_Institution :
Dept. of Phys., Brno Univ. of Technol.
fDate :
6/28/1905 12:00:00 AM
Abstract :
Transport and noise characteristic of forward biased 2.3 mum CW GaSb laser diodes were measured in order to evaluate new technology. From the measurement results it follows that noise spectral density related to defects is of 1/f type and its magnitude was found to be proportional to the square of DC forward current at low injection levels
Keywords :
"Diode lasers","Low-frequency noise","Noise measurement","Frequency","Noise generators","Contact resistance","Electrical resistance measurement","Voltage measurement","Thermal resistance","Physics"
Conference_Titel :
Microelectronics, 2006 25th International Conference on
Print_ISBN :
1-4244-0117-8
DOI :
10.1109/ICMEL.2006.1650954
