• DocumentCode
    3622159
  • Title

    Influence of Simultaneous Mechanical and Electrical Straining on Conventional Thick-Film Resistors

  • Author

    Z. Stanimirovic;M.M. Jevtic;I. Stanimirovic

  • Author_Institution
    IRITEL A.D., Belgrade
  • fYear
    2006
  • fDate
    6/28/1905 12:00:00 AM
  • Firstpage
    587
  • Lastpage
    590
  • Abstract
    In this paper the results from a study of simultaneous mechanical and electrical straining effects on performances of conventional thick-film resistors based on resistor composition with sheet resistance of 1kOmega/sq are presented. For experimental purposes a series of thick-film test resistors with different geometries were realized and subjected to simultaneous electrical and mechanical straining using 1.2/50mus pulses in combination with mechanical substrate deflection of 300mum. Obtained experimental results were analyzed and correlation between resistance, noise index and gauge factor changes with resistor degradation due to simultaneous impact of these two types of straining were observed
  • Keywords
    "Resistors","Performance evaluation","Electrical resistance measurement","Electric resistance","Mechanical variables measurement","Electric variables measurement","Thickness measurement","Materials testing","Force measurement","Geometry"
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2006 25th International Conference on
  • Print_ISBN
    1-4244-0117-8
  • Type

    conf

  • DOI
    10.1109/ICMEL.2006.1651035
  • Filename
    1651035