• DocumentCode
    3622491
  • Title

    Novel power transistor design for a process independent high voltage option in standard CMOS

  • Author

    A. Heringa;J. Sonsky

  • Author_Institution
    Philips Research Leuven, Kapeldreef 75, B-3001 Leuven, Belgium
  • fYear
    2006
  • fDate
    6/28/1905 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    High voltage transistors can be implemented in standard CMOS by interleaving drain extensions with STI using the fine STI/active patterns. This approach facilitates integration of high voltage transistors in modern processes without increasing processing complexity. This paper presents an in depth analysis of simulation and experimental data in a commercial 90 nm CMOS process. It is shown that the STI layout in the channel and the drain extension can be optimised separately which results in a better current drive of the resulting voltage transistors. The scope and limits of this device concept are discussed
  • Keywords
    "Power transistors","Process design","CMOS process","Diodes","Breakdown voltage","Measurement standards","Interleaved codes","Silicon","Dielectric measurements","Power measurement"
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC´s, 2006. ISPSD 2006. IEEE International Symposium on
  • Print_ISBN
    0-7803-9714-2
  • Type

    conf

  • DOI
    10.1109/ISPSD.2006.1666137
  • Filename
    1666137