DocumentCode :
3622491
Title :
Novel power transistor design for a process independent high voltage option in standard CMOS
Author :
A. Heringa;J. Sonsky
Author_Institution :
Philips Research Leuven, Kapeldreef 75, B-3001 Leuven, Belgium
fYear :
2006
fDate :
6/28/1905 12:00:00 AM
Firstpage :
1
Lastpage :
4
Abstract :
High voltage transistors can be implemented in standard CMOS by interleaving drain extensions with STI using the fine STI/active patterns. This approach facilitates integration of high voltage transistors in modern processes without increasing processing complexity. This paper presents an in depth analysis of simulation and experimental data in a commercial 90 nm CMOS process. It is shown that the STI layout in the channel and the drain extension can be optimised separately which results in a better current drive of the resulting voltage transistors. The scope and limits of this device concept are discussed
Keywords :
"Power transistors","Process design","CMOS process","Diodes","Breakdown voltage","Measurement standards","Interleaved codes","Silicon","Dielectric measurements","Power measurement"
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and IC´s, 2006. ISPSD 2006. IEEE International Symposium on
Print_ISBN :
0-7803-9714-2
Type :
conf
DOI :
10.1109/ISPSD.2006.1666137
Filename :
1666137
Link To Document :
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