DocumentCode
3622491
Title
Novel power transistor design for a process independent high voltage option in standard CMOS
Author
A. Heringa;J. Sonsky
Author_Institution
Philips Research Leuven, Kapeldreef 75, B-3001 Leuven, Belgium
fYear
2006
fDate
6/28/1905 12:00:00 AM
Firstpage
1
Lastpage
4
Abstract
High voltage transistors can be implemented in standard CMOS by interleaving drain extensions with STI using the fine STI/active patterns. This approach facilitates integration of high voltage transistors in modern processes without increasing processing complexity. This paper presents an in depth analysis of simulation and experimental data in a commercial 90 nm CMOS process. It is shown that the STI layout in the channel and the drain extension can be optimised separately which results in a better current drive of the resulting voltage transistors. The scope and limits of this device concept are discussed
Keywords
"Power transistors","Process design","CMOS process","Diodes","Breakdown voltage","Measurement standards","Interleaved codes","Silicon","Dielectric measurements","Power measurement"
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and IC´s, 2006. ISPSD 2006. IEEE International Symposium on
Print_ISBN
0-7803-9714-2
Type
conf
DOI
10.1109/ISPSD.2006.1666137
Filename
1666137
Link To Document