• DocumentCode
    3622883
  • Title

    Problems of application of X-ray standing wave technique (XSW) to the study of implanted crystals

  • Author

    J. Auleytner;P. Dluzewski;J. Pelka

  • Author_Institution
    Inst. of Phys., Polish Acad. of Sci., Warsaw, Poland
  • fYear
    1991
  • fDate
    6/13/1905 12:00:00 AM
  • Firstpage
    544
  • Lastpage
    547
  • Abstract
    The aim of the authors´ work is to discuss some problems of application of the XSW technique to study monocrystalline materials implanted with heavy ions and then annealed by high power pulsed laser. The approximation of quasi-perfect lattice seems in this case not quite satisfied because of large radiation damage. Thus, there is a need for a slightly modified approach to the experimental XSW data analysis. As an example of XSW measurements the results on Si
  • Keywords
    "Crystals","Impurities","Annealing","Lattices","Atomic measurements","Fluorescence","Crystalline materials","Distributed computing","X-ray diffraction","Optical reflection"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Devices and Systems, 1991. RADECS 91., First European Conference on
  • Print_ISBN
    0-7803-0208-7
  • Type

    conf

  • DOI
    10.1109/RADECS.1991.213541
  • Filename
    213541