Is there any future for deterministic self-test of embedded RAMs?

The authors demonstrate that RAM BIST techniques based on deterministic test procedures are very inefficient in detection of non-target faults, i.e., faults not included in fault models used for test development. Estimates of the defect coverage indicate that deterministic RAM BIST schemes are unlikely to meet future test quality requirements. The authors also show that, contrary to common belief, self-test schemes based on random patterns have a potential to provide, a very high quality of testing within acceptable time limits for megabit embedded memories.