• DocumentCode
    3623564
  • Title

    New model parameter extraction environment for the submicron circuit models

  • Author

    C.-H. Choi;J.-K. Park;Y.-G. Kim;K.-H. Kim;S.-H. Lee

  • Author_Institution
    Samsung Electronics, South Korea
  • fYear
    1993
  • Firstpage
    1535
  • Abstract
    A model parameter extraction system, called APEX (advanced model parameter extractor), is described. APEX provides the knowledge-assistant algorithm, which leads an optimizer to find optimal parameters automatically, and it also provides useful environments to obtain DC and AC parameters which guarantee good agreement with C-V data and the inverter chain delay, as well as I-V data. The experimental results using APEX show that optimal DC and AC parameter sets, including temperature parameters at different temperatures, can be easily and accurately obtained for the various sizes of transistors within a reasonable time.
  • Keywords
    "Parameter extraction","Circuits","MOSFETs","Data mining","Capacitance-voltage characteristics","Equations","Algorithm design and analysis","Inverters","Temperature","Curve fitting"
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS ´93, 1993 IEEE International Symposium on
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • DOI
    10.1109/ISCAS.1993.394028
  • Filename
    394028