• DocumentCode
    3623753
  • Title

    Simulation of Reduction Properties of Radiated Emission by On-chip Decoupling Capacitor

  • Author

    Toshio Sudo;Manabu Bonkohara

  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    15
  • Lastpage
    18
  • Keywords
    "Capacitors","Finite difference methods","Circuit simulation","Packaging","Time domain analysis","Frequency","Large scale integration","Inductance","Circuit noise","Degradation"
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings
  • Print_ISBN
    0-7803-9821-1
  • Type

    conf

  • DOI
    10.1109/SPI.2002.258278
  • Filename
    4027643
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3623753