DocumentCode :
3623768
Title :
Charge-based on-chip measurement technique for the selective extraction of cross-coupling capacitances
Author :
Alessandro Bogliolo;Loris Vendrame;Luca Bortesi;Ezio Barachetti
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
75
Lastpage :
77
Keywords :
"Measurement techniques","Capacitance measurement","Semiconductor device measurement","Integrated circuit measurements","Current measurement","Parasitic capacitance","Testing","Transducers","MOSFETs","Integrated circuit interconnections"
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings
Print_ISBN :
0-7803-9821-1
Type :
conf
DOI :
10.1109/SPI.2002.258287
Filename :
4027661
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3623768
