• DocumentCode
    3623777
  • Title

    LFSR Test Pattern Crosstalk in Nanometer Technologies

  • Author

    Dieter Treytnar;Michael Redeker;Hartmut Grabinski;F.M. Ktata

  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    115
  • Lastpage
    118
  • Keywords
    "Crosstalk","Integrated circuit technology","Circuit testing","Geometry","Integrated circuit interconnections","Frequency","Inductance","Capacitance","Integrated circuit testing","Transmission lines"
  • Publisher
    ieee
  • Conference_Titel
    Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings
  • Print_ISBN
    0-7803-9821-1
  • Type

    conf

  • DOI
    10.1109/SPI.2002.258315
  • Filename
    4027673
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3623777