3623794

The Improvement of Signal Integrity (SI) according to The Location of Via in The Vicinity of A Slot in The Reference Plane

Tae Honjunho Lee;Junho Kim;Hyungsoo Kim;Pil Jung Jun;Joungho Kim

2002

6/24/1905 12:00:00 AM

185

188

"Printed circuits","Dielectric measurements","Digital integrated circuits","Signal design","Circuit simulation","Circuit testing","Noise reduction","Integrated circuit noise","Integrated circuit technology","Integrated circuit interconnections"

ieee

Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings

0-7803-9821-1

conf

10.1109/SPI.2002.258311

4027692