• DocumentCode
    3623983
  • Title

    The cost of quality

  • fYear
    2006
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given, as follows. A record of the panel discussion was not made available for publication as part of the conference proceedings. This panel will focus on some of the most important issues in test-the quality and cost of test. The panelists representing major providers and buyers of silicon will debate the business aspects of the problem. What does "Quality" mean from business point of view? What is driving it? Is "Quality at any cost" the right answer? How can "Test" be a competitive advantage and value-added in the IC industry? How should IC suppliers and customers collaborate on quality and test issues? What are the new emerging areas and needs for tools and equipment?
  • Keywords
    "Costs","Automotive engineering","Manufacturing","Application specific integrated circuits","Engineering management","Technology management","Design engineering","Integrated circuit testing","Collaboration"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC ´06. IEEE International
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0291-3
  • Electronic_ISBN
    2378-2250
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297748
  • Filename
    4079426