3623986

Role of Test in Yield Learning for 65nm and Beyond

Rene Segers

DfX Program manager, Philips Semiconductors

2006

1

1

"Electrostatic discharge","Manufacturing processes","Semiconductor device manufacture","Semiconductor device testing","Timing","Fault diagnosis","Design for manufacture","Robustness","Electronic design automation and methodology","Lead compounds"

ieee

Test Conference, 2006. ITC ´06. IEEE International

1089-3539

1-4244-0291-3

2378-2250

conf

10.1109/TEST.2006.297771

4079449