DocumentCode
36240
Title
A Self-Authenticating Chip Architecture Using an Intrinsic Fingerprint of Embedded DRAM
Author
Rosenblatt, Sami ; Chellappa, Srivatsan ; Cestero, Albert ; Robson, Norman ; Kirihata, Toshiaki ; Iyer, Srikanth S.
Author_Institution
IBM Syst. & Technol. Group, Hopewell Junction, NY, USA
Volume
48
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
2934
Lastpage
2943
Abstract
An architecture for enabling self-authenticating chips uses 4 Kb electrically programmable fuses (eFUSE) to store bit strings representing encrypted intrinsic fingerprints obtained by offset-superimposing six out of one thousand 4 Kb domains randomly chosen in 4 Mb embedded DRAM. Authentication is accomplished by regenerating various encrypted intrinsic fingerprints, which are then compared with the bit strings in the eFUSE. Monte Carlo simulations demonstrate that, targeting an average of 32 retention fails per domain, the strings are unique and authentication is statistically guaranteed without bit correction even when unstable bits are introduced. The preliminary results are confirmed in > 50 parts containing 4 Mb memory implemented in 22-nm SOI hardware under the target voltage ±10% conditions. The analytical model predicts > 10 20 years to crack the encryption by brute force, while satisfying > 99.9999% successful authentication for one million parts.
Keywords
DRAM chips; Monte Carlo methods; cryptographic protocols; silicon-on-insulator; Monte Carlo simulations; SOI hardware; eFUSE; electrically programmable fuses; embedded DRAM; intrinsic fingerprint; self-authenticating chip architecture; size 22 nm; storage capacity 4 Mbit; Arrays; Authentication; Databases; Encryption; Hardware; Random access memory; Embedded DRAM; ID; hardware counterfeit; hardware security; physically unclonable functions (PUFs);
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2013.2282114
Filename
6617665
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