3624072

IIRW 2006 Discussion Group Summary : High-κ Reliability

2006

219

219

"Pulse measurements","CMOS technology","Annealing","Degradation","Character generation","Current measurement","Charge measurement","Energy measurement","Dielectric materials","Production"

ieee

Integrated Reliability Workshop Final Report, 2006 IEEE International

1930-8841

1-4244-0296-4

2374-8036

conf

10.1109/IRWS.2006.305258

4098735