مرکز منطقه ای اطلاع رساني علوم و فناوري - IIRW Discussion Group Summary : Interconnects

DocumentCode :

3624074

Title :

IIRW Discussion Group Summary : Interconnects

fYear :

2006

Firstpage :

221

Lastpage :

221

Keywords :

"Testing","Current density","Heating","Dielectrics","Metallization","Copper","Thermal stresses","Electromigration","Temperature","Samarium"

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report, 2006 IEEE International

ISSN :

1930-8841

Print_ISBN :

1-4244-0296-4

Electronic_ISBN :

2374-8036

Type :

conf

DOI :

10.1109/IRWS.2006.305260

Filename :

4098737

Link To Document :