DocumentCode :
3624458
Title :
Calculation of the Radiation Patterns of Axially Symmetric Reflectors
Author :
Erdem Yazgan;Mehmet Safak
Author_Institution :
Hacettepe University, Department of Electrical and Electronic Engineering, Beytepe, Ankara, Turkey
fYear :
1980
Firstpage :
78
Lastpage :
83
Abstract :
Scattered fields from axially symmetric reflectors (paraboloid, ellipsoid, hyperboloid, spheroid and plane) are calculated by high-frequency asymptotic techniques. For this purpose, the scattered fields from an axially symmetric reflector are expressed in terms of the reflector eccentricity. By using appropriate eccentricity values, the scattered fields from a reflector of any eccentricity can be obtained in a unified form. With the help of this approach, the effect of eccentricity on the focusing property of reflectors is studied.
Keywords :
"Optical scattering","Mie scattering","Ellipsoids","Physical optics","Shape","Antenna radiation patterns","Reflector antennas","Optical surface waves","Optical diffraction","Frequency"
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1980. 10th European
Type :
conf
DOI :
10.1109/EUMA.1980.332809
Filename :
4131457
Link To Document :
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