DocumentCode :
3624485
Title :
Formation of sharp-apex pyramids for active tips used in scanning probe microscopy
Author :
J. Soltys;D. Gregusova;R. Kudela;A. Satka;I. Kostic;V. Cambel
Author_Institution :
Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava, Slovakia. e-mail: jan.soltys@savba.sk
fYear :
2006
Firstpage :
105
Lastpage :
108
Abstract :
This work is a part of a deeper study into technologies developed for the so-called active tips for use in scanning probe microscopy. This paper show that using an AlAs facet-forming sacrificial layer and a H 3PO4, H2O2, H2O based solution, symmetric pyramidal structures with tip diameter below 35 nm can be prepared. Such pyramidal objects was used for further MOCVD overgrowth. Finally, the quality of the mesa sidewalls obtained was controlled using the SEM and AFM. The pyramids are suitable for the next processing, and various semiconductor devices can be prepared on the pyramid
Keywords :
"Scanning probe microscopy","Atomic force microscopy","Scanning electron microscopy","Magnetic force microscopy","Gallium arsenide","Thermal force","Mechanical variables measurement","MOCVD","Semiconductor materials","Spatial resolution"
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2006. ASDAM ´06. International Conference on
Print_ISBN :
1-4244-0369-0
Type :
conf
DOI :
10.1109/ASDAM.2006.331165
Filename :
4133089
Link To Document :
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