Posteriori frequency spectrum correction for test signal imperfections in ADC testing

The lack of a precise stimulus for ADC testing has initiated many researches of alternative methods based on posteriori correction of the measured signal. Several types of correction in the frequency domain have already been analyzed in e.g. [Zhongjun Yu, et al., 2004], [Slepicka, D., 2005]. However, these corrections either require many external components of which design could also be more complex [Slepicka, D., 2005] or were not analyzed in practical conditions yet [Zhongjun Yu, et al., 2004]. The latter method is therefore analyzed and extended in this paper for the practical usage and the results of measurement on a real ADC are shown.