DocumentCode :
3626309
Title :
Influence of Medium Dose Rate X and Gamma Radiation and Bias Conditions on Characteristics of Low-Dropout Voltage Regulators with Lateral and Vertical Serial PNP Transistors
Author :
Vladimir Vukic;Predrag Osmokrovic;Srboljub Stankovic
Author_Institution :
Institute of Electrical Engineering "Nikola Tesla", Koste Glavini?a 8a, 11000 Beograd, Serbia & Montenegro, phone +38111-3690-548, fax. +38111-3690-823, e-mail: vvukic@ieent.org
fYear :
2005
Abstract :
Voltage regulators were exposed to the influence of medium dose rate X and gamma radiation, in two modes: without bias, and with bias and load Examined integrated circuits are representatives of low-dropout voltage regulators with lateral and vertical PNP transistor: LM2940 and L4940. Results of the experiment, including the change of serial transistor dropout voltage and maximum output current as a function of total ionizing dose of X and gamma radiation, were presented for Commercial-Off-The-Shelf lC´s from two batches of each manufacturer.
Keywords :
"Gamma rays","Voltage","Regulators","Radiative recombination","Ionizing radiation","Spontaneous emission","Integrated circuit technology","Bipolar integrated circuits","Leakage current","Neutrons"
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
ISSN :
0379-6566
Print_ISBN :
978-0-7803-9501-5
Type :
conf
DOI :
10.1109/RADECS.2005.4365647
Filename :
4365647
Link To Document :
بازگشت