• DocumentCode
    3626309
  • Title

    Influence of Medium Dose Rate X and Gamma Radiation and Bias Conditions on Characteristics of Low-Dropout Voltage Regulators with Lateral and Vertical Serial PNP Transistors

  • Author

    Vladimir Vukic;Predrag Osmokrovic;Srboljub Stankovic

  • Author_Institution
    Institute of Electrical Engineering "Nikola Tesla", Koste Glavini?a 8a, 11000 Beograd, Serbia & Montenegro, phone +38111-3690-548, fax. +38111-3690-823, e-mail: vvukic@ieent.org
  • fYear
    2005
  • Abstract
    Voltage regulators were exposed to the influence of medium dose rate X and gamma radiation, in two modes: without bias, and with bias and load Examined integrated circuits are representatives of low-dropout voltage regulators with lateral and vertical PNP transistor: LM2940 and L4940. Results of the experiment, including the change of serial transistor dropout voltage and maximum output current as a function of total ionizing dose of X and gamma radiation, were presented for Commercial-Off-The-Shelf lC´s from two batches of each manufacturer.
  • Keywords
    "Gamma rays","Voltage","Regulators","Radiative recombination","Ionizing radiation","Spontaneous emission","Integrated circuit technology","Bipolar integrated circuits","Leakage current","Neutrons"
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9501-5
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365647
  • Filename
    4365647