• DocumentCode
    3626493
  • Title

    Application of Integral Analysis Technique to Determine Signal- and Power Integrity of Advanced Packages

  • Author

    Nebojsa Nenadovic;Ekkehard Miersch;Martin Versleijen;Sidina Wane

  • Author_Institution
    NXP Semiconductors, Gerstweg 2, Building FD 3.037,6534 AE Nijmegen, The Netherlands. email: nebojsa.nenadovic@nxp.com
  • fYear
    2007
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    In this paper an application of an integral analysis technique is demonstrated for determining signal integrity (SI) and power integrity (PI) of complex and advanced package solutions. A representative system-in-package (SiP) product has been selected as a carrier for our study, which is focused on analysis methodology, tools and flow. In particular, possibility to easily support what-if simulations for SI and PI, including analysis with distributed on-chip decoupling capacitors is investigated and highlighted. Importance of balancing between accuracy, CPU time and ease-of-use is also underlined.
  • Keywords
    "Signal analysis","Semiconductor device packaging","Integrated circuit packaging","Integrated circuit modeling","Capacitors","Design engineering","Electronic design automation and methodology","Databases","Analytical models","Lead compounds"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2007 IEEE
  • ISSN
    2165-4107
  • Print_ISBN
    978-1-4244-0883-2
  • Electronic_ISBN
    2165-4115
  • Type

    conf

  • DOI
    10.1109/EPEP.2007.4387155
  • Filename
    4387155