DocumentCode
3626493
Title
Application of Integral Analysis Technique to Determine Signal- and Power Integrity of Advanced Packages
Author
Nebojsa Nenadovic;Ekkehard Miersch;Martin Versleijen;Sidina Wane
Author_Institution
NXP Semiconductors, Gerstweg 2, Building FD 3.037,6534 AE Nijmegen, The Netherlands. email: nebojsa.nenadovic@nxp.com
fYear
2007
Firstpage
183
Lastpage
186
Abstract
In this paper an application of an integral analysis technique is demonstrated for determining signal integrity (SI) and power integrity (PI) of complex and advanced package solutions. A representative system-in-package (SiP) product has been selected as a carrier for our study, which is focused on analysis methodology, tools and flow. In particular, possibility to easily support what-if simulations for SI and PI, including analysis with distributed on-chip decoupling capacitors is investigated and highlighted. Importance of balancing between accuracy, CPU time and ease-of-use is also underlined.
Keywords
"Signal analysis","Semiconductor device packaging","Integrated circuit packaging","Integrated circuit modeling","Capacitors","Design engineering","Electronic design automation and methodology","Databases","Analytical models","Lead compounds"
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging, 2007 IEEE
ISSN
2165-4107
Print_ISBN
978-1-4244-0883-2
Electronic_ISBN
2165-4115
Type
conf
DOI
10.1109/EPEP.2007.4387155
Filename
4387155
Link To Document