• DocumentCode
    3627089
  • Title

    Advanced tunable protective structure against electrostatic discharge

  • Author

    Betak Petr;Novacek Kamil

  • Author_Institution
    Department of Microelectronics, FEEC, BUT, Brno, Czech republic. Email: petr.betak@phd.feec.vutbr.cz
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    ESD (electrostatic discharge) protection structures act as a protection of integrated circuits against parasitic electrostatic discharge events. They are located on input or output (I/O) pads. The use of such structures provides better robustness against ESD but also a number of secondary parasitic effects which limit the circuit performance. These effects, for example, limit the bandwidth of processed signals, causes bigger noise or lower gain. Among often used structures belong structures known as SCR (silicon controlled rectifier). Structures like SCR have some disadvantages, therefore they can not be universally usable. This text is dealing with advanced SCR structure, which overcomes disadvantages of conventional SCR protection cell. Physical principle of this new structure allows required features tuning by geometrical adjustments only.
  • Keywords
    "Protection","Electrostatic discharge","Thyristors","Anodes","Cathodes","Breakdown voltage","Circuit optimization","Clamps","Microelectronics","Leakage current"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 30th International Spring Seminar on
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4244-1217-4
  • Electronic_ISBN
    2161-2064
  • Type

    conf

  • DOI
    10.1109/ISSE.2007.4432906
  • Filename
    4432906