DocumentCode :
3627619
Title :
Power-Aware Testing and Test Strategies for Low Power Devices
Author :
Dimitris Gizopoulos;Kaushik Roy;Patrick Girard;Nicola Nicolici;Xiaoqing Wen
Author_Institution :
Piraeus U, GR
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Keywords :
"Testing","Power dissipation","Electronic design automation and methodology","Libraries","Manufacturing","Design optimization","Pareto optimization","Energy management","Design for testability","Reliability engineering"
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE ´08
ISSN :
1530-1591
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
1558-1101
Type :
conf
DOI :
10.1109/DATE.2008.4484642
Filename :
4484642
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3627619
