Title :
Panel Session - Caution Ahead: The Road to Design and Manufacturing at 32 and 22 nm
Author :
S Turnoy;P Wintermayr;R Aitken;R Lauwereins;J Tracy Weed;V Kiefer;J Hartmann
Author_Institution :
Synopsys, USA
fDate :
3/1/2008 12:00:00 AM
Conference_Titel :
Design, Automation and Test in Europe, 2008. DATE ´08
Print_ISBN :
978-3-9810801-3-1
Electronic_ISBN :
1558-1101
DOI :
10.1109/DATE.2008.4484732
