DocumentCode :
36277
Title :
Measurement of Silicon Micromachined Waveguide Components at 500–750 GHz
Author :
Reck, Theodore J. ; Jung-Kubiak, Cecile ; Gill, Jaswinder ; Chattopadhyay, Goutam
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
4
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
33
Lastpage :
38
Abstract :
This paper presents techniques used to assemble and measure micromachined submillimeter-wave waveguide circuits operating from 500 to 750 GHz. A novel micromechanical compression pin is developed to improve wafer-to-wafer alignment to less than 1 μm. Connection between the silicon waveguide and the VNA is aligned through a silicon boss that inserts into the custom waveguide flange. Waveguide loss is characterized for both E- and H-plane split waveguides and is found to be similar to standard metal waveguides. Finally, measurement of a 3 dB hybrid coupler operating from 500 to 600 GHz is presented.
Keywords :
elemental semiconductors; micromachining; micromechanical devices; silicon; submillimetre wave couplers; waveguides; E-plane split waveguide; H-plane split waveguide; VNA; frequency 500 GHz to 750 GHz; hybrid coupler; micromachined submillimeter-wave waveguide circuits; micromechanical compression pin; silicon boss; silicon micromachined waveguide component; standard metal waveguides; wafer-to-wafer alignment; waveguide flange; waveguide loss; Couplers; Loss measurement; Metals; Pins; Silicon; Waveguide components; Waveguide discontinuities; Rectangular waveguide; silicon micromachining; submillimeter-wave; terahertz (THz) frequencies;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2013.2282534
Filename :
6617668
Link To Document :
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