Title :
Excitation optimization in fault diagnosis of analog electronic circuits
Author :
L. Chruszczyk;J. Rutkowski
Author_Institution :
SILESIAN UNIVERSITY OF TECHNOLOGY, INSTITUTE OF ELECTRONICS, GLIWICE, POLAND
Abstract :
This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extractio by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.
Keywords :
"Fault diagnosis","Electronic circuits","Circuit faults","Circuit testing","Circuit simulation","Feature extraction","Electrical fault detection","Dictionaries","Wavelet transforms","Data mining"
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Print_ISBN :
978-1-4244-2276-0
DOI :
10.1109/DDECS.2008.4538802
