3628020

Measurement and Simulation of Self-Heating in DMOS Transistors up to Very High Temperatures

; ;

2008

209

212

"Temperature sensors","Sensor arrays","Electrothermal effects","Semiconductor device measurement","Temperature measurement","Power measurement","Transistors","Semiconductor optical amplifiers","Numerical simulation","Spatial resolution"

ieee

Power Semiconductor Devices and IC´s, 2008. ISPSD ´08. 20th International Symposium on

1063-6854

978-1-4244-1532-8

1946-0201

conf

10.1109/ISPSD.2008.4538935

4538935