Copyright statement

fYear

2008

Keywords

"Permission","Advertising","Libraries","Conference management"

Publisher

ieee

Conference_Titel

VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on

Print_ISBN

978-1-4244-1616-5

Type

conf

DOI

10.1109/VDAT.2008.4542392

Filename

4542392

Link To Document