DocumentCode :
3629148
Title :
Profile measurement of objects by using stockwell and continuous wavelet transforms
Author :
Ozlem Kocahan;Emre Coskun;Serhat Ozder
Author_Institution :
?anakkale Onsekiz Mart ?niversitesi, Fen Edebiyat Fak., Fizik B?l?m?, 17100 Turkey
fYear :
2008
fDate :
4/1/2008 12:00:00 AM
Firstpage :
1
Lastpage :
4
Abstract :
In this study, 3D profile measurements of objects are tested with integral transforms by using a standard fringe projection technique consisting of a CCD (charge-coupled device) camera and a projector. The surface profile of a rough object is studied experimentally with crossed optical axes geometry. A two dimensional fringe pattern by introducing the carrier frequencies in two spatial directions, x and y, is analyzed with S-transform and continuous wavelet transform based on Morlet wavelet algorithms. Phase gradient and phase methods are presented for continuous wavelet transform (CWT) and S-transform of the fringe pattern. At the end, results of experimental application of these techniques are compared.
Keywords :
"Wavelet transforms","Transforms","Continuous wavelet transforms","Optical films","Optical signal processing","Optical imaging","Wavelet analysis"
Publisher :
ieee
Conference_Titel :
Signal Processing, Communication and Applications Conference, 2008. SIU 2008. IEEE 16th
ISSN :
2165-0608
Print_ISBN :
978-1-4244-1998-2
Type :
conf
DOI :
10.1109/SIU.2008.4632736
Filename :
4632736
Link To Document :
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