• DocumentCode
    3629598
  • Title

    Semiconductor materials for optoelectronic THz systems activated by long-wavelength lasers

  • Author

    A. Krotkus;R. Adomavicius;V. Pacebutas

  • Author_Institution
    Semiconductor Physics Institute (SPI), 01108, A. Gostauto 11, Vilnius, Lithuania
  • fYear
    2008
  • Firstpage
    18
  • Lastpage
    20
  • Abstract
    Semiconductor materials that can be used for manufacturing THz emitters and THz detectors for pulsed optoelectronic terahertz time-domain spectroscopy systems activated by femtosecond lasers of the infrared wavelength range are reviewed. THz emission from unbiased surfaces of various semiconductors has been investigated and analyzed; it was shown that the best emitter is p-type InAs crystal. Optoelectronic THz detectors were manufactured from several semiconducting materials that are meeting the requirements for such devices such as sub-picosecond electron lifetime, high electron mobility, and large dark resistivity. The best results were achieved when using low-temperature-grown GaBiAs epitaxial layers. Characteristics of THz optoelectronic system employing GaBiAs detector (the frequency bandwidth of 5 THz and the dynamical range of 60 dB) were comparable to those systems based on the Ti:sapphire lasers and GaAs photoconducting antennae.
  • Keywords
    "Semiconductor materials","Semiconductor lasers","Surface emitting lasers","Semiconductor device manufacture","Infrared detectors","Electron mobility","Optical pulses","Time domain analysis","Spectroscopy","Infrared spectra"
  • Publisher
    ieee
  • Conference_Titel
    THz Radiation: Basic Research and Applications, 2008. TERA 2008. International Workshop
  • Print_ISBN
    978-1-4244-2686-7
  • Type

    conf

  • DOI
    10.1109/TERA.2008.4673822
  • Filename
    4673822