DocumentCode
3629598
Title
Semiconductor materials for optoelectronic THz systems activated by long-wavelength lasers
Author
A. Krotkus;R. Adomavicius;V. Pacebutas
Author_Institution
Semiconductor Physics Institute (SPI), 01108, A. Gostauto 11, Vilnius, Lithuania
fYear
2008
Firstpage
18
Lastpage
20
Abstract
Semiconductor materials that can be used for manufacturing THz emitters and THz detectors for pulsed optoelectronic terahertz time-domain spectroscopy systems activated by femtosecond lasers of the infrared wavelength range are reviewed. THz emission from unbiased surfaces of various semiconductors has been investigated and analyzed; it was shown that the best emitter is p-type InAs crystal. Optoelectronic THz detectors were manufactured from several semiconducting materials that are meeting the requirements for such devices such as sub-picosecond electron lifetime, high electron mobility, and large dark resistivity. The best results were achieved when using low-temperature-grown GaBiAs epitaxial layers. Characteristics of THz optoelectronic system employing GaBiAs detector (the frequency bandwidth of 5 THz and the dynamical range of 60 dB) were comparable to those systems based on the Ti:sapphire lasers and GaAs photoconducting antennae.
Keywords
"Semiconductor materials","Semiconductor lasers","Surface emitting lasers","Semiconductor device manufacture","Infrared detectors","Electron mobility","Optical pulses","Time domain analysis","Spectroscopy","Infrared spectra"
Publisher
ieee
Conference_Titel
THz Radiation: Basic Research and Applications, 2008. TERA 2008. International Workshop
Print_ISBN
978-1-4244-2686-7
Type
conf
DOI
10.1109/TERA.2008.4673822
Filename
4673822
Link To Document