• DocumentCode
    3629648
  • Title

    Visual cluster analysis of trajectory data with interactive Kohonen Maps

  • Author

    Tobias Schreck;Jurgen Bernard;Tatiana Tekusova;Jorn Kohlhammer

  • Author_Institution
    Interactive Graphics Systems Group, TU Darmstadt, Germany
  • fYear
    2008
  • Firstpage
    3
  • Lastpage
    10
  • Abstract
    Visual-interactive cluster analysis provides valuable tools for effectively analyzing large and complex data sets. Due to desirable properties and an inherent predisposition for visualization, the Kohonen Feature Map (or Self-Organizing Map, or SOM) algorithm is among the most popular and widely used visual clustering techniques. However, the unsupervised nature of the algorithm may be disadvantageous in certain applications. Depending on initialization and data characteristics, cluster maps (cluster layouts) may emerge that do not comply with user preferences, expectations, or the application context. Considering SOM-based analysis of trajectory data, we propose a comprehensive visual-interactive monitoring and control framework extending the basic SOM algorithm. The framework implements the general Visual Analytics idea to effectively combine automatic data analysis with human expert supervision. It provides simple, yet effective facilities for visually monitoring and interactively controlling the trajectory clustering process at arbitrary levels of detail. The approach allows the user to leverage existing domain knowledge and user preferences, arriving at improved cluster maps. We apply the framework on a trajectory clustering problem, demonstrating its potential in combining both unsupervised (machine) and supervised (human expert) processing, in producing appropriate cluster results.
  • Keywords
    "Data analysis","Trajectory","Self organizing feature maps","Clustering algorithms","Monitoring","Automatic control","Humans","Data visualization","Algorithm design and analysis","Visual analytics"
  • Publisher
    ieee
  • Conference_Titel
    Visual Analytics Science and Technology, 2008. VAST ´08. IEEE Symposium on
  • Print_ISBN
    978-1-4244-2935-6
  • Type

    conf

  • DOI
    10.1109/VAST.2008.4677350
  • Filename
    4677350