DocumentCode
3629684
Title
Influence of geometrical parameters of mutual parallel paths on process of disturbances propagation
Author
Wlodzimierz Kalita;Wieslaw Sabat;Dariusz Klepacki;Kazimierz Kamuda
Author_Institution
Rzeszow University of Technology, Dept. of Electronic and Communication Systems, W.Pola 2, 35-959, Poland
fYear
2008
Firstpage
1091
Lastpage
1096
Abstract
The problems connected with electromagnetic couplings between mutual parallel paths in planar structures made in thick-film technology have been presented in the paper. The influence of geometrical configuration of thick-film path systems on shape of transfer function between them has been analyzed. The modification of transfer function under changes of the particular geometrical factors has been quantitatively determined using elaborated computer programs. The results of calculations have been presented for the selected path configurations.
Keywords
"Circuits","Transfer functions","Capacitance","Inductance","Crosstalk","Electromagnetic propagation","Paper technology","Microelectronics","Conducting materials","Dielectric substrates"
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference, 2008. ESTC 2008. 2nd
Print_ISBN
978-1-4244-2813-7
Type
conf
DOI
10.1109/ESTC.2008.4684503
Filename
4684503
Link To Document