• DocumentCode
    3629902
  • Title

    BIST and delay fault detection

  • Author

    S. Pilarski;A. Pierzynska

  • Author_Institution
    Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • fYear
    1993
  • Firstpage
    236
  • Lastpage
    242
  • Abstract
    We propose simple modifications to existing BIST schemes. These modifications significantly improve the path delay fault coverage. For example, a modified circular self-test path can detect a significant number of path delay faults within a reasonable test running time.
  • Keywords
    "Built-in self-test","Fault detection","Circuit faults","Circuit testing","Automatic testing","Test pattern generators","Electrical fault detection","Robustness","Delay effects","Clocks"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470697
  • Filename
    470697
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3629902