• DocumentCode
    3630130
  • Title

    The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias

  • Author

    Nicola Zanolla;Domagoj Siprak;Marc Tiebout;Peter Baumgartner;Enrico Sangiorgi;Claudio Fiegna

  • Author_Institution
    ARCES - DEIS, University of Bologna & IU.NET, Via Venezia 52, 47023 Cesena, Italy
  • fYear
    2008
  • Firstpage
    80
  • Lastpage
    83
  • Abstract
    The impact of substrate bias on random telegraph signal (RTS) and flicker noise in MOSFETs operating under switched gate bias is investigated by accurate experiments.
  • Keywords
    "1f noise","Low-frequency noise","Noise reduction","Noise figure","Dielectrics","Paper technology","Frequency","MOSFET circuits","CMOS technology","Telegraphy"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
  • Print_ISBN
    978-1-4244-2185-5
  • Type

    conf

  • DOI
    10.1109/ICSICT.2008.4734476
  • Filename
    4734476
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3630130