Title :
The impact of substrate bias on RTS and flicker noise in MOSFETs operating under switched gate bias
Author :
Nicola Zanolla;Domagoj Siprak;Marc Tiebout;Peter Baumgartner;Enrico Sangiorgi;Claudio Fiegna
Author_Institution :
ARCES - DEIS, University of Bologna & IU.NET, Via Venezia 52, 47023 Cesena, Italy
Abstract :
The impact of substrate bias on random telegraph signal (RTS) and flicker noise in MOSFETs operating under switched gate bias is investigated by accurate experiments.
Keywords :
"1f noise","Low-frequency noise","Noise reduction","Noise figure","Dielectrics","Paper technology","Frequency","MOSFET circuits","CMOS technology","Telegraphy"
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Print_ISBN :
978-1-4244-2185-5
DOI :
10.1109/ICSICT.2008.4734476
