DocumentCode :
3630386
Title :
The advanced noise model for an IDN based restoration of black and white pictures captured by a camera with CCD/CMOS sensor
Author :
Daniel Kekrt;Milos Klima
Author_Institution :
Faculty of Electrical Engineering, Czech Technical University Technick? 2, 166 27 Praha, Czech Republic
fYear :
2008
Firstpage :
126
Lastpage :
130
Abstract :
The deterministic blurring and noising in pictures captured by a camera with CCD/CMOS sensor can be fairly simulated as the true image transmission through some kind of ISI channel, with specific 2D impulse response (blurring) and consequently through certain random IECS-ML channel (noising). Hence for purposes of image restoration we can use the maximal a posteriori probability (MAP) criterion based iterative detection network (IDN), that is powered by the noise model and contains a number of mutually concatenated functional blocks so-called soft inversions (SISOs). This cellular structure makes an IDN suboptimal but also numerically very simple and practically applicable in contrast to an unviable optimal (single-stage) MAP detector. This paper is dedicated to the detailed description of the comprehensive noise model that controls the IECS-ML channel and that is applied in the IDN front-end, so-called the soft output demodulator (SODEM). There will be introduced three different examples of IDN front-ends for simpler IDNs, designed only for recovery of black and white images.
Keywords :
"Semiconductor device modeling","CMOS image sensors","Charge-coupled image sensors","Cameras","Charge coupled devices","Image restoration","Image communication","Intersymbol interference","Concatenated codes","Detectors"
Publisher :
ieee
Conference_Titel :
Security Technology, 2008. ICCST 2008. 42nd Annual IEEE International Carnahan Conference on
ISSN :
1071-6572
Print_ISBN :
978-1-4244-1816-9
Electronic_ISBN :
2153-0742
Type :
conf
DOI :
10.1109/CCST.2008.4751290
Filename :
4751290
Link To Document :
بازگشت