DocumentCode :
3631269
Title :
Numerical approach to extraction of elasto-plastic material models and corresponding properties of thin layers through nanoindentation technique
Author :
Artur Wymyslowski;O. Wittler;R. Mrossko;Rainer Dudek;Juergen Auersperg;Lukasz Dowhan
Author_Institution :
Wroc?aw University of Technology, Faculty of Microsystem Electronics and Photonics, ul. Janiszewskiego 11/17, 50-372, Poland
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
1
Lastpage :
7
Abstract :
Current developments and trends in microelectronics are focused on thin layers and novel materials. This leads to application of different test and measurement methods, which are capable to measure basic mechanical properties of such materials on micro-scale and nano-scale. The presented project focuses on application of the nanoindentation technique in order to extract the basic elastic and elasto-plastic mechanical properties of aluminium through analytical and numerical approaches. The results allowed to select the most appropriate elastoplastic material model that would be capable of fitting the experimental and numerical results. According to the performed analysis it was concluded that Ramberg-Osgood model fulfil the above criteria and can be used to predict the nanoindentation results in case of very thin aluminium layers.
Keywords :
"Shape measurement","Material properties","Algorithm design and analysis","Data mining","Packaging","Materials testing","Electrical resistance measurement","Analytical models","Optimization methods","Numerical analysis"
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, 2009. EuroSimE 2009. 10th International Conference on
Print_ISBN :
978-1-4244-4159-4;978-1-4244-4160-0
Type :
conf
DOI :
10.1109/ESIME.2009.4938422
Filename :
4938422
Link To Document :
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