• DocumentCode
    3631538
  • Title

    Comparison of different test strategies on a mixed-signal circuit

  • Author

    Juraj Brenkus;Viera Stopjakova;Ronny Vanhooren;Anton Chichkov

  • Author_Institution
    Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia
  • fYear
    2009
  • Firstpage
    16
  • Lastpage
    19
  • Abstract
    An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.
  • Keywords
    "Circuit testing","Costs","Production","Circuit faults","Semiconductor device testing","Manufacturing processes","Radio frequency","Silicon","Environmental economics","Analog integrated circuits"
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS ´09. 12th International Symposium on
  • Print_ISBN
    978-1-4244-3341-4
  • Type

    conf

  • DOI
    10.1109/DDECS.2009.5012090
  • Filename
    5012090
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3631538