DocumentCode
3631807
Title
Test Technology Technical Council (TTTC)
fYear
2009
Keywords
"Technical Councils","USA Councils","Logic testing","System testing","Technical activities","Electronic equipment testing","Meetings","Conferences","Logic design","Art"
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2009. VTS ´09. 27th IEEE
ISSN
1093-0167
Print_ISBN
978-0-7695-3598-2
Type
conf
DOI
10.1109/VTS.2009.68
Filename
5116598
Link To Document