DocumentCode :
3631808
Title :
Test Technology Educational Program (TTEP) Tutorials
fYear :
2009
Keywords :
"Tutorial","Educational technology","Educational programs","Circuit testing","Silicon","Integrated circuit testing","Failure analysis","Manufacturing","Engineering management","Integrated circuit reliability"
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2009. VTS ´09. 27th IEEE
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3598-2
Type :
conf
DOI :
10.1109/VTS.2009.69
Filename :
5116599
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3631808