DocumentCode
3631837
Title
Iddt testing of continuous-time filters
Author
J. Arguelles;M.J. Lopez;J. Blanco;M. Martinez;S. Bracho
Author_Institution
Dept. de Electron., Cantabria Univ., Santander, Spain
fYear
1995
Firstpage
101
Lastpage
106
Abstract
A Design-for-Test (DfT) methodology is proposed to perform an analysis of the dynamic supply current consumption as a testing methodology for continuous time filters. A built-in current sensor has been developed to analyze the dynamic current and a partitioning methodology, based on this sensor, has been developed to improve test reliability on large circuits under test. The DfT proposal allows one to use a conventional digital automatic test equipment (ATE) on this analog circuit type. Some experimental results are reported to illustrate the proposed DfT method.
Keywords
"Circuit testing","Circuit faults","Filters","Design for testability","Analog circuits","Current supplies","Electronic equipment testing","Automatic testing","Integrated circuit reliability","Automatic test equipment"
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
ISSN
1093-0167
Print_ISBN
0-8186-7000-2
Type
conf
DOI
10.1109/VTEST.1995.512624
Filename
512624
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