• DocumentCode
    3631837
  • Title

    Iddt testing of continuous-time filters

  • Author

    J. Arguelles;M.J. Lopez;J. Blanco;M. Martinez;S. Bracho

  • Author_Institution
    Dept. de Electron., Cantabria Univ., Santander, Spain
  • fYear
    1995
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    A Design-for-Test (DfT) methodology is proposed to perform an analysis of the dynamic supply current consumption as a testing methodology for continuous time filters. A built-in current sensor has been developed to analyze the dynamic current and a partitioning methodology, based on this sensor, has been developed to improve test reliability on large circuits under test. The DfT proposal allows one to use a conventional digital automatic test equipment (ATE) on this analog circuit type. Some experimental results are reported to illustrate the proposed DfT method.
  • Keywords
    "Circuit testing","Circuit faults","Filters","Design for testability","Analog circuits","Current supplies","Electronic equipment testing","Automatic testing","Integrated circuit reliability","Automatic test equipment"
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1995. Proceedings., 13th IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7000-2
  • Type

    conf

  • DOI
    10.1109/VTEST.1995.512624
  • Filename
    512624