Title :
Iddt testing of continuous-time filters
Author :
J. Arguelles;M.J. Lopez;J. Blanco;M. Martinez;S. Bracho
Author_Institution :
Dept. de Electron., Cantabria Univ., Santander, Spain
Abstract :
A Design-for-Test (DfT) methodology is proposed to perform an analysis of the dynamic supply current consumption as a testing methodology for continuous time filters. A built-in current sensor has been developed to analyze the dynamic current and a partitioning methodology, based on this sensor, has been developed to improve test reliability on large circuits under test. The DfT proposal allows one to use a conventional digital automatic test equipment (ATE) on this analog circuit type. Some experimental results are reported to illustrate the proposed DfT method.
Keywords :
"Circuit testing","Circuit faults","Filters","Design for testability","Analog circuits","Current supplies","Electronic equipment testing","Automatic testing","Integrated circuit reliability","Automatic test equipment"
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512624