DocumentCode :
3631837
Title :
Iddt testing of continuous-time filters
Author :
J. Arguelles;M.J. Lopez;J. Blanco;M. Martinez;S. Bracho
Author_Institution :
Dept. de Electron., Cantabria Univ., Santander, Spain
fYear :
1995
Firstpage :
101
Lastpage :
106
Abstract :
A Design-for-Test (DfT) methodology is proposed to perform an analysis of the dynamic supply current consumption as a testing methodology for continuous time filters. A built-in current sensor has been developed to analyze the dynamic current and a partitioning methodology, based on this sensor, has been developed to improve test reliability on large circuits under test. The DfT proposal allows one to use a conventional digital automatic test equipment (ATE) on this analog circuit type. Some experimental results are reported to illustrate the proposed DfT method.
Keywords :
"Circuit testing","Circuit faults","Filters","Design for testability","Analog circuits","Current supplies","Electronic equipment testing","Automatic testing","Integrated circuit reliability","Automatic test equipment"
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
ISSN :
1093-0167
Print_ISBN :
0-8186-7000-2
Type :
conf
DOI :
10.1109/VTEST.1995.512624
Filename :
512624
Link To Document :
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