DocumentCode
3632469
Title
We Have Got Compression, What Next?
Author
Janusz Rajski
fYear
2009
Keywords
"Circuit testing","Graphics","Logic testing","Technological innovation","Business","Circuit faults","Electrical engineering","Silicon","Integrated circuit technology","Logic design"
Publisher
ieee
Conference_Titel
Test Symposium, 2009 14th IEEE European
ISSN
1530-1877
Print_ISBN
978-0-7695-3703-0
Type
conf
DOI
10.1109/ETS.2009.27
Filename
5170450
Link To Document