مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3632469

Title :

We Have Got Compression, What Next?

Author :

Janusz Rajski

fYear :

2009

Keywords :

"Circuit testing","Graphics","Logic testing","Technological innovation","Business","Circuit faults","Electrical engineering","Silicon","Integrated circuit technology","Logic design"

Publisher :

ieee

Conference_Titel :

Test Symposium, 2009 14th IEEE European

ISSN :

1530-1877

Print_ISBN :

978-0-7695-3703-0

Type :

conf

DOI :

10.1109/ETS.2009.27

Filename :

5170450

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3632469