3632470

Something I Always Wanted to Know About Test, But Was Afraid to Ask

Christian Landrault

2009

"Circuit faults","Retirement","Automatic testing","Automatic control","Computer science","Fault tolerance","Computer architecture","Digital systems","Robots","Microelectronics"

ieee

Test Symposium, 2009 14th IEEE European

1530-1877

978-0-7695-3703-0

conf

10.1109/ETS.2009.28

5170451