DocumentCode :
3632830
Title :
Design of experiments of AlN reactive sputtering
Author :
Pavel Mach;Jana Kolarova
Author_Institution :
Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Czech Republic
fYear :
2009
Firstpage :
1
Lastpage :
4
Abstract :
Reactive sputtering has been used for fabrication of AlN films. The process has been investigated in two levels of power of a generator, in two levels of the working pressure and in two levels of the working gas flow. The AlN films have been fabricated on a bottom Al electrodes and after sputtering of the AlN film a top Al electrode has been evaporated across the bottom one. This way capacitors have been formed. The capacitance and the loss factor of these capacitors have been measured. The process of fabrication of AlN films has been mathematically described using DOE.
Keywords :
"Sputtering","Optical films","Substrates","Capacitors","US Department of Energy","Dielectric thin films","Chemical vapor deposition","Argon","Plasma temperature","Magnetic films"
Publisher :
ieee
Conference_Titel :
Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
ISSN :
2161-2528
Print_ISBN :
978-1-4244-4260-7
Electronic_ISBN :
2161-2064
Type :
conf
DOI :
10.1109/ISSE.2009.5206938
Filename :
5206938
Link To Document :
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