• DocumentCode
    3632830
  • Title

    Design of experiments of AlN reactive sputtering

  • Author

    Pavel Mach;Jana Kolarova

  • Author_Institution
    Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Czech Republic
  • fYear
    2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Reactive sputtering has been used for fabrication of AlN films. The process has been investigated in two levels of power of a generator, in two levels of the working pressure and in two levels of the working gas flow. The AlN films have been fabricated on a bottom Al electrodes and after sputtering of the AlN film a top Al electrode has been evaporated across the bottom one. This way capacitors have been formed. The capacitance and the loss factor of these capacitors have been measured. The process of fabrication of AlN films has been mathematically described using DOE.
  • Keywords
    "Sputtering","Optical films","Substrates","Capacitors","US Department of Energy","Dielectric thin films","Chemical vapor deposition","Argon","Plasma temperature","Magnetic films"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on
  • ISSN
    2161-2528
  • Print_ISBN
    978-1-4244-4260-7
  • Electronic_ISBN
    2161-2064
  • Type

    conf

  • DOI
    10.1109/ISSE.2009.5206938
  • Filename
    5206938