• DocumentCode
    3633130
  • Title

    DC Transient Monitoring and analysis to prevent EOS in burn-in systems

  • Author

    Yong Jaimsomporn;Surapol Phunyapinuant;Wayne Tan

  • Author_Institution
    Advanced Micro Devices, Bangkok Thailand
  • fYear
    2001
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    This paper describes a Direct Current (DC) Transient Monitoring system integrated in burn-in test systems, to detect exceed voltages and occurrences per period limits, and record readings into a database for analysis of noise (physical and behavior). The system has features to automatically shut down a burn-in system to prevent damage to devices under test from electrical overstress (EOS) events.
  • Keywords
    "Transient analysis","Monitoring","Earth Observing System","Connectors","System testing","Power supplies","Instruments","Data analysis","Life testing","Grounding"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD ´01.
  • Type

    conf

  • Filename
    5254977
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3633130