DocumentCode
3633149
Title
ESD control and design for extremely sensitive ("Class 0") devices
Author
Robert Perry
Author_Institution
Seagate, USA
fYear
2006
Firstpage
364
Lastpage
364
Abstract
Summary form only given, as follows. Due to cost and other considerations, the ESDA believes that more and more devices, including common integrated circuits, will have "Class 0" (< 100V HBM) ESD damage thresholds. It is not just magnetic recording anymore, and the "old rules" of ESD control sometimes are not sufficient. This workshop will discuss methods which did, and methods which did not, work in ESD control for class 0 devices. A record of the panel discussion was not made available for publication as part of the conference proceedings.
Keywords
"Electrostatic discharge","Instruments","Earth Observing System","Testing","Stress","Protection","Test equipment","Europe"
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
Electronic_ISBN
2164-9340
Type
conf
Filename
5256760
Link To Document