• DocumentCode
    3633149
  • Title

    ESD control and design for extremely sensitive ("Class 0") devices

  • Author

    Robert Perry

  • Author_Institution
    Seagate, USA
  • fYear
    2006
  • Firstpage
    364
  • Lastpage
    364
  • Abstract
    Summary form only given, as follows. Due to cost and other considerations, the ESDA believes that more and more devices, including common integrated circuits, will have "Class 0" (< 100V HBM) ESD damage thresholds. It is not just magnetic recording anymore, and the "old rules" of ESD control sometimes are not sufficient. This workshop will discuss methods which did, and methods which did not, work in ESD control for class 0 devices. A record of the panel discussion was not made available for publication as part of the conference proceedings.
  • Keywords
    "Electrostatic discharge","Instruments","Earth Observing System","Testing","Stress","Protection","Test equipment","Europe"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD ´06.
  • Electronic_ISBN
    2164-9340
  • Type

    conf

  • Filename
    5256760